Thanks to the contributions of many domestic and international researchers in various disciplines of engineering, the Journal of the Chinese Institute of Engineers (JCIE) has grown into one of the internationally leading journals. The JCIE therefore has been included in some widespread databases such as Science Citation Index (SCI), engineering Index, SciSearch, Reasearch Alert, SciCurrentnt Contents/Engineering, Computing, and Technology. With the intention of further upgrading the JCIE and making it a more internationally influential journal, we will in the future stress more on building up the relations with other internationally prestigious conferences and, if possible, publish some of their distinguished papers.

Also, effective from June 2001, four arrangements and adjustments below have be made to help making the JCIE a more well-organized journal and more accessible for authors. First, to facilitate the inquiry of paper status and other related information, we now offer internet service at the website; jcie.ntust.edu.tw/. Next, every submission to the JCIE is required to provide an appropriate subject index found in every issue of the journal. Third, since a short paper only accounts for anew idea, result, or innovation rather than a significant exposition in the related fields, we will place a stricter limitation on its length (see Information for Authors for details).Last, since the JCIE covers various fields of Engineering, for easy reference we will try to compile those accepted technically related papers in the same issue as well as arrange some special issues for specific topics.

We are very proud to announce that from 2011, JCIE is published with the leading international publisher, Taylor & Francis. Established in London in 1798, Taylor & Francis is the world's oldest commercial journals publisher. We ask for your patience and understanding whilst the journal makes necessary transitions.

Thank you for your interest in the JCIE and we look forward to your further contributions.

Best wishes,

Jia-Yush Yen
Editor-in-Chief